HIGH-VOLUME PRODUCTION TEST
Production test leaders need a smarter alternative to traditional ATE to meet cost and coverage requirements of increasingly complex RF and mixed-signal ICs.
LAB CHARACTERIZATION AND VALIDATION
Industry leaders need to meet the latest RF and mixed-signal IC test challenges efficiently to improve time to market and reduce capital equipment costs.
WAFER-LEVEL PARAMETRIC TEST
Wafer-level test engineers need to reduce test time without sacrificing measurement quality and accuracy.
FLEXIBLE SEMICONDUCTOR TEST SOLUTIONS
As the devices we use get smarter, they become more software centric, and the semiconductor industry that is powering these smart devices is going through a transformation not only in how the ICs are designed and manufactured but also in how they are tested. Regardless of the type of smart device, the business drivers are the same. IC makers must deliver more integrated functionality, ensure the highest reliability for mission-critical applications, remain highly cost competitive, and ensure a short time to market to meet tight design windows. NI delivers smarter test solutions that scale from the lab to the production floor and meet the business needs of IC manufacturers.
FEATURED CONTENT
Adopting the PXI Platform and setting up a global standard validation practice allowed Melexis to increase test throughput, reduce setup times and contributed to higher quality products.
Configure LabVIEW and PXI to develop a MEMS test system that reduces capital equipment costs by 11X over the previous automated test equipment used in production.
PXI with source measurement units enable development of highly parallel measurement system that reduces wafer loss and costs, and allows faster adjustments to the semiconductor process flow.
Designers and test engineers working on wideband 5G devices require accurate, fast, and cost-effective test solutions to ensure the reliability of new chip designs. Learn about the top test challenges and solutions for wideband 5G IC test.
Whether you are testing power management ICs or RF power amplifiers, taking quality DC measurements is a cornerstone of testing semiconductor chips. Improve measurement accuracy and product quality by applying these foundational best practice