Performs voltage, current, resistance, temperature, inductance, capacitance, and frequency/period measurements, as well as diode tests, in PXI systems.
Performs characterization and production test of semiconductor devices with timing sets and per channel pin parametric measurement unit (PPMU).
Generates and analyzes static and dynamic digital waveforms that interface to digital electronics using single‐ended and differential voltage levels.
Integrates non-PXI instruments into your PXI system using the GPIB standard.
Provides multigigabit transceivers used to validate the proper operation of SerDes interfaces and to stream data over high-speed serial data links.
Analyzes intermediate frequency (IF) data for use in communications applications and superheterodyne receiver architectures.
Connect any input to any output to simplify wiring in automated test systems.
Adds FPGA-based signal processing capability to PXI systems and can stream at a high bandwidth.
Combines A/D converter technologies with Xilinx FPGAs for applications that demand real-time signal processing and high-performance analog input.
Combines high-speed data converters with Xilinx FPGAs for applications that demand real-time signal processing and high-performance analog input.
Combines high-speed DACs with Xilinx FPGAs for applications that demand real-time signal processing and high-performance analog input.
Combines high-speed DACs with Xilinx FPGAs for applications that demand real-time signal processing and high-performance analog input.
Converts broadband light signals to electricity for optical test applications.
Acquires and analyzes time- and frequency‐domain analog signals as part of a PXI system.
Replicates the behavior of resistance‐based devices by controlling a series of relays that varies resistance across each I/O connector channel.
Supplies programmable DC power for applications ranging from characterization, design validation, and manufacturing test.
Provides timed pulses of programmable frequency, pulse delay, width, spacing, and amplitude.
Connect or disconnect individual relays to simplify wiring in automated test systems.
Controls external relays using an internal power source or external power source.
Enables you to communicate with and control external serial hardware from a PXI or PXI Express chassis using asynchronous serial interfaces that support a variety of protocols.
Simulates open, pin-to-pin, short-to-battery, and short-to-ground faults for hardware-in-the-loop (HIL) and electronic reliability testing.
Provides precise voltage or current sourcing and measurement capabilities for PXI systems.
Switches loads between two sources at frequencies up to 40 GHz.